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ION TOF USA Inc.

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We provide cutting-edge TOF‑SIMS and LEIS surface analysis instruments, software, and services to high‑tech industries, backed by expert support from our US operations.

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⚙️ Advanced Instrumentation

IONTOF USA provides high-performance SIMS instruments—including the M6, M6 Plus, and M6 Hybrid SIMS—alongside Qtac LEIS systems and the powerful SurfaceLab 7 software suite.

? Sales & Consultation

The team offers expert consultation and sales support, guiding clients in selecting the right analytical tools to meet their research and industrial goals.

? Analytical Services

Through collaboration with Tascon USA, IONTOF provides specialized analytical services, extending access to advanced TOF-SIMS and LEIS capabilities without the need for direct ownership.

?️ Local Service & Support

IONTOF USA’s U.S.-based service team ensures rapid response, preventative maintenance, and expert technical assistance—minimizing downtime and maximizing performance.

? Trusted Across Industries

From semiconductors and biotech to pharmaceuticals, advanced materials, and beyond, leading companies and research institutions rely on IONTOF instrumentation to solve complex surface analysis challenges.

Features

Trusted & Verified
Expert Technical Team
Advanced Instrumentation
Global Expertise, Local Support
Precision & Reliability
Customer Satisfaction
Industry-Leading Performance
Proven Analytical Results

Location

100 Red Schoolhouse Road, Suite A10, , Spring Valley, Rockland County, New York 10977, United States
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